Ultrafine Test Socket Aims to Boost HBM Yields
Orum Material developed a MEMS-based ultrafine test socket capable of probing 65 μm pitch micro-bumps on HBM4 dies with ±1.0 μm accuracy. This addresses the testing bottleneck for stacked DRAM. Neutral impact on spot prices as it remains in prototype validation.
- Related manufacturers
- Orum Material
- Impact score
- 10 / 100, low impact