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k-Space launches XRF thin-film metrology tool
What happened
k-Space Associates has launched the kSA XRF, an x-ray fluorescence tool for measuring ultra-thin films in semiconductor and optoelectronic manufacturing. This is a new product introduction in the specialized metrology equipment segment. Neutral: This is a niche tool launch unlikely to directly impact component supply, demand, or pricing in the near term.
Impact and signal
Low impactImpact score: 15/100
Affected components and suppliers
Semiconductor Manufacturing Equipment
k-Space Associates Inc
metrologyproduct-launchmanufacturing-tools
Source and time
Source: Semiconductor Today · 1/17/2023 · View original source
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