NuAxi Stream - Real-Time Semiconductor Intelligence

Wed, Sep 3

20:47Impact score 12
Nagoya spinoff Photo electron Soul’s GaN-based e-beam technology targets semiconductor inspection & metrology
KIOXIA Iwate Corp will begin evaluating a GaN-based electron-beam technology developed by Nagoya University spinoff Photo electron Soul Inc in late September. The technology targets semiconductor inspection and metrology applications. Neutral: This is a long-term R&D milestone with no immediate impact on component supply, demand, or pricing.
Semiconductor Inspection EquipmentKIOXIA Iwate CorpSemiconductor TodayTechnical

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