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Nagoya spinoff Photo electron Soul’s GaN-based e-beam technology targets semiconductor inspection & metrology
What happened
KIOXIA Iwate Corp will begin evaluating a GaN-based electron-beam technology developed by Nagoya University spinoff Photo electron Soul Inc in late September. The technology targets semiconductor inspection and metrology applications. Neutral: This is a long-term R&D milestone with no immediate impact on component supply, demand, or pricing.
Impact and signal
Low impactImpact score: 12/100
Affected components and suppliers
Semiconductor Inspection Equipment
KIOXIA Iwate Corp
R&DmetrologyGaN
Source and time
Source: Semiconductor Today · 9/3/2025 · View original source
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