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JEDEC publishes test method for addressing switching energy loss associated with output capacitance hysteresis
What happened
JEDEC has published a new standard, JEP200, defining test methods for measuring switching energy loss in GaN and SiC power devices. The standard was developed by JEDEC's JC-70 committee, whose membership has grown from 23 to over 80 companies since 2017. Neutral: This is a technical standardization milestone with no immediate impact on supply, demand, or pricing for power semiconductors.
Impact and signal
Low impactImpact score: 8/100
Affected components and suppliers
GaN Power DevicesSiC Power Devices
standardizationtestingwide-bandgap
Source and time
Source: Semiconductor Today · 9/12/2024 · View original source
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