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Self-Heating And Parasitics Challenge Multi-Tier CFET Scaling (TU Munich, IIT Kanpur)
What happened
Researchers at the Technical University of Munich and the Indian Institute of Technology Kanpur published a study titled 'Self-Heating and Parasitic Effects in Multi-Tier CFET Design.' The abstract states that the study examines the impact of self-heating effects (SHEs) and middle of line (MOL) and back-end of line (BEOL) induced parasitics on multi-tier CFET design, in which multiple nanosheet devices are vertically stacked. This is a technical research publication; it does not involve any price, capacity, or supply-demand change.
Impact and signal
Low impactImpact score: 25/100
Affected components and suppliers
multi-tier CFETnanosheet devices
CFETself-heating effectsparasiticsresearch publicationscaling
Source and time
Source: Semiconductor Engineering · 10/26/2026 · View original source
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