Teradyne Magnum E2 addresses advanced DRAM and high-speed NAND flash

What happened

Teradyne introduced the Magnum E2, a high-speed memory test system for advanced DRAM and high-speed NAND flash interfaces. Built on Teradyne's Near-DUT Test (NDT) architecture, it is applicable for LPDDR6, DDR6, GDDR7, and NAND flash interfaces, supports high-speed NRZ, PAM3, and PAM4 signalling, offers up to 64 test sites with 24.5K high-speed I/O pins, and enables both production and engineering configurations, covering qualification through high-volume manufacturing on a common hardware and software platform. The company says its design matches test demands driven by AI and high-performance computing; Ben Han, president of the Memory Test division, said that as the industry moves to advanced DRAM and high-speed NAND flash for enterprise SSDs, the Magnum E2 was built to eliminate the trade-off between signal integrity and throughput. The source does not state any price or supply impact.

Impact and signal

Affected components and suppliers

Source and time

Source: Electronics Weekly · 10/7/2026 · View original source