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ACM introduces post-CMP cleaning tool for silicon and SiC substrate manufacturing
What happened
ACM Research has launched a new post-CMP cleaning tool for silicon and SiC substrate manufacturing. The tool aims to improve yield and throughput in advanced substrate processing. Neutral: This is a background technical development with no immediate, direct impact on component supply, demand, or pricing.
Impact and signal
Low impactImpact score: 10/100
Affected components and suppliers
SiC Substrates
ACM Research Inc
equipmentmanufacturingyield
Source and time
Source: Semiconductor Today · 7/13/2022 · View original source
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