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Soitec boosting SmartSiC wafer manufacturing yield using KLA Surfscan SP A2 unpatterned inspection system
What happened
Soitec has selected KLA's Surfscan SP A2 unpatterned wafer inspection system to improve the manufacturing yield of its SmartSiC engineered substrates for automotive silicon carbide devices. This partnership aims to enhance process control in the production of a key material for the EV and power electronics markets. Neutral: This is a long-term process improvement with no immediate, quantifiable impact on wafer supply, pricing, or trader inventory decisions.
Impact and signal
Low impactImpact score: 10/100
Affected components and suppliers
SiC WafersSmartSiC
SoitecKLA Corp
manufacturingyieldprocess-control
Source and time
Source: Semiconductor Today · 7/15/2022 · View original source
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