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Spirox and Southport launch first non-destructive SiC defect inspection system
What happened
Spirox Corp and its subsidiary Southport Corp have launched the JadeSiC-NK, a non-destructive defect inspection system for SiC substrates, which is estimated to save a manufacturer with 100 furnaces $7.68 million annually by replacing destructive KOH etching. This technology aims to increase production yields and reduce costs in the SiC substrate manufacturing process. Neutral: While this improves manufacturing efficiency, it is a long-term process enhancement with no immediate, direct impact on spot market pricing or supply/demand balance for traders.
Impact and signal
Low impactImpact score: 15/100
Affected components and suppliers
SiC Substrates
Spirox CorpSouthport Corp
yield-improvementcost-reductioninspection
Source and time
Source: Semiconductor Today · 12/1/2023 · View original source
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