NuAxiSemiconductor trade intelligence
Aehr wins first order for FOX-NP wafer-level test & burn-in system for GaN
What happened
Aehr Test Systems received an initial order for its FOX-NP wafer-level test and burn-in system from a leading global supplier of GaN power devices for electric vehicles. This indicates growing adoption of Aehr's specialized test solutions for wide-bandgap semiconductors. Neutral: This is a company-specific development for a capital equipment supplier with no immediate, direct impact on component supply, pricing, or trader inventory decisions.
Impact and signal
Low impactImpact score: 15/100
Affected components and suppliers
GaN Power Devices
Aehr Test Systems
test-equipmentwide-bandgapGaN
Source and time
Source: Semiconductor Today · 12/14/2023 · View original source
Open the NuAxi live feed →
Real-time pricing, supply signals and AI analysis for semiconductor traders