NuAxiSemiconductor trade intelligence
Ancora’s double-side-cooling GaN FET demonstrates robustness and long-term reliability
What happened
Ancora Semiconductor's double-side-cooling GaN FETs have passed DMTBF tests, demonstrating a mean time between failures of 200,000 hours. This reliability milestone supports the adoption of its GaN technology in high-end power supplies like the XPG FUSION 1600W unit. Neutral: This is a technical validation with no immediate impact on supply, demand, or pricing for traders.
Impact and signal
Low impactImpact score: 10/100
Affected components and suppliers
GaN FETPower Supply Components
Ancora Semiconductor IncDelta Electronics Inc
reliabilitytestingpower-electronics
Source and time
Source: Semiconductor Today · 2/28/2024 · View original source
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