NuAxiSemiconductor trade intelligence
Advantest announces KGD test cell for power semiconductors
What happened
Advantest has launched an integrated Known Good Die (KGD) test cell combining its CREA MT series power device testers with a new HA1100 die prober, targeting yield improvement for wide-bandgap power semiconductors. This is an equipment announcement focused on enhancing testing efficiency for a specific, high-growth semiconductor segment. Neutral: This is a capital equipment development with no immediate, direct impact on component supply, demand, or pricing for traders.
Impact and signal
Low impactImpact score: 10/100
Affected components and suppliers
Power SemiconductorsWide-Bandgap (WBG) Devices
Advantest Corp
test-equipmentyield-improvementKGD
Source and time
Source: Semiconductor Today · 12/9/2024 · View original source
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