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New customer selects Aehr’s FOX system for wafer-level test and burn-in of SiC devices for EVs
What happened
Aehr Test Systems announced a new customer has selected its FOX-P system for wafer-level test and burn-in of silicon carbide devices destined for electric vehicles. This indicates continued investment in SiC manufacturing capacity to meet growing EV demand. Neutral: This is a background equipment order with no immediate, direct impact on component supply, pricing, or inventory levels for traders.
Impact and signal
Low impactImpact score: 10/100
Affected components and suppliers
SiC Power Devices
Aehr Test Systems
test-equipmentevsic
Source and time
Source: Semiconductor Today · 1/30/2023 · View original source
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