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New customer orders Aehr FOX-NP multi-wafer test and burn-in system for silicon carbide MOSFETs

What happened

Aehr Test Systems received an initial order for its FOX-NP multi-wafer test and burn-in system for silicon carbide MOSFETs. The order includes WaferPak Contactors and an Aligner for engineering, qualification, and small-lot production. This is a background development in production tooling with no immediate, direct impact on component supply, demand, or pricing.

Impact and signal

Low impactImpact score: 15/100

Affected components and suppliers

Silicon Carbide MOSFETs
Aehr Test Systems
test-equipmentsicproduction-tool

Source and time

Source: Semiconductor Today · 9/19/2023 · View original source

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