NuAxiSemiconductor trade intelligence
Aehr receives order from new customer for FOX-NP multi-wafer test & burn-in system
What happened
Aehr Test Systems received an initial order from a new customer for its FOX-NP wafer-level test and burn-in system, along with WaferPak Contactors and an Aligner, for SiC device qualification and small-lot production. This indicates continued investment in SiC manufacturing capacity and reliability testing infrastructure. Neutral: The order is for capital equipment and does not directly signal an immediate change in SiC component supply, demand, or pricing.
Impact and signal
Low impactImpact score: 15/100
Affected components and suppliers
Silicon Carbide (SiC) Power Devices
Aehr Test Systems
test-equipmentSiCproduction-capacity
Source and time
Source: Semiconductor Today · 4/3/2024 · View original source
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