NuAxiSemiconductor trade intelligence
Teradyne announces production system for double-sided wafer probe test for silicon photonics
What happened
Teradyne and ficonTEC have announced the first high-volume, double-sided wafer probe test cell for silicon photonics. This development is driven by growing demand for testing from co-packaged optics (CPO) applications. Neutral: This is a long-term enabling technology for future chip production, with no immediate impact on component supply, demand, or pricing.
Impact and signal
Low impactImpact score: 12/100
Affected components and suppliers
Silicon Photonics Test Equipment
Teradyne IncficonTEC Service GmbH
product-launchtest-equipmentphotonics
Source and time
Source: Semiconductor Today · 4/4/2025 · View original source
Open the NuAxi live feed →
Real-time pricing, supply signals and AI analysis for semiconductor traders